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7
J. Kim, H. Lee, and S. Lee, "Replicated process allocation for load distribution in fault-tolerant multiprocessors,"IEEE Trans. Computers, Vol.46, No. 4, pp.499-504, April 1997.
J. Kim, H. Lee, and S. Lee, "Replicated process allocation for load distribution in fault-tolerant multiprocessors,"IEEE Trans. Computers, Vol.46, No. 4, pp.499-504, April 1997.
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6
S. Lee and J. Kim, "Path selection for message passing in a circuit-switched multicomputer," J. Parallel and Distributed Computing, Vol. 35, pp. 211-218, 1996.
S. Lee and J. Kim, "Path selection for message passing in a circuit-switched multicomputer," J. Parallel and Distributed Computing, Vol. 35, pp. 211-218, 1996.
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5
S. Lee and K. G. Shin, "Optimal multiple syndrome diagnosis,"IEEE Trans. Parallel and Distributed Systems, Vol. 5, No. 6, pp. 630-638, June 1994.
S. Lee and K. G. Shin, "Optimal multiple syndrome diagnosis,"IEEE Trans. Parallel and Distributed Systems, Vol. 5, No. 6, pp. 630-638, June 1994.
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4
S. Lee and K. G. Shin, "Interleaved all-to-all reliable broadcast on Meshes and hypercubes,"IEEE Trans. Parallel and Distributed Systems, Vol. 5, No. 5, pp. 449-458, May 1994.
S. Lee and K. G. Shin, "Interleaved all-to-all reliable broadcast on Meshes and hypercubes,"IEEE Trans. Parallel and Distributed Systems, Vol. 5, No. 5, pp. 449-458, May 1994.
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3
S. Lee and K. G. Shin, "Probabilistic diagnosis of multiprocessor systems,"ACM Computing Surveys, Vol. 26, No. 1, pp. 121-139, March 1994.
S. Lee and K. G. Shin, "Probabilistic diagnosis of multiprocessor systems,"ACM Computing Surveys, Vol. 26, No. 1, pp. 121-139, March 1994.
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2
S. Lee and K. G. Shin, "Optimal and efficient probabilistic distributed diagnosis schemes,"IEEE Trans. Computers, vol. 42, No. 7, pp. 882-886, July 1993.
S. Lee and K. G. Shin, "Optimal and efficient probabilistic distributed diagnosis schemes,"IEEE Trans. Computers, vol. 42, No. 7, pp. 882-886, July 1993.
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1
S. Lee and K. G. Shin, "Design-for-test using partial parallel scan,"IEEE Trans. CAD/ICAS, Vol. 9, No. 2, pp. 203-211, February 1990.
S. Lee and K. G. Shin, "Design-for-test using partial parallel scan,"IEEE Trans. CAD/ICAS, Vol. 9, No. 2, pp. 203-211, February 1990.